Feature |
Elrepho 450X |
| Instrument Type |
dual-beam spectrophotometer |
| Measurement Geometry |
diffuse illumination and 0° viewing |
| Illumination Source |
pulsed xenon filtered to approximate D65 |
| Sphere Diameter |
152 mm / 6.0 in |
| Spectral Analyzer |
proprietary SP2000 analyzer with dual 256 diode array and high resolution holographic grating |
| Wavelength Range |
360 nm to 700 nm |
| Reporting Interval |
10 nm |
| Effective Bandwidth |
10 nm |
| Wavelength Resolution |
2 nm |
| Photometric Range: |
0 to 200% |
| Photometric Resolution |
0.003% |
| Black Trap |
high performance |
| 20 Read Repeatability On The White Tile Using Dual Flash (CIELAB) |
0.02 (max) |
| Inter-instrument Agreement1 (CIELAB) |
0.4 (maximum), 0.2 (average) |
| Lens |
3 position auto zoom |
| XLAV Aperture plate |
34 mm illuminated and 30 mm measured |
| SAV Aperture plate |
9 mm illuminated and 5 mm measured |
| USAV Aperture plate |
6.5 mm illuminated and 2.5 mm measured |
| Automatic UV Control |
automatic UV calibration for the measurement of fluorescent specimens with UV cutoff filters at 395 nm, 420 nm and 460 nm |
| Vertical Mount |
includes peephole sample viewer and pedestal sample holder |
| Height |
640 mm / 25 3/16 in |
| Width |
312 mm / 12 5/16 in |
| Depth |
371 mm / 14 5/8 in |
| Weight |
19.05 kg / 42 lb |
| Power Requirements |
85 to 264 VAC, 47 to 63 Hz, 80 VA peak, 35 VA typical |
| Absolute Operating Range |
5° to 40° C, 5% to 85% non-condensing relative humidity |
| Interface |
RS-232 9600/19200 baud or USB |
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