Designed for the Paper Industry
Designed for the Paper Industry
Datacolor ELREPHO is a high performance spectrophotometer made for the paper industry, perfect for the reference laboratory or production control of color, brightness, opacity, yellowness and whiteness measurements of pulp, paper and chemicals used in paper and coating manufacturing. The dual beam spectrophotometer with diffuse/0° optical geometry and an adjustable UV filter conforms to ISO 2469.
Easy Application & Efficient Workflow
Easy Application & Efficient Workflow
Simple operation of sample presentation and alignment is facilitated by the vertical configuration and through-the-sphere sample viewer, enabling faster measurement throughput. Three aperture plates are included with the instrument. SAV and USAV plates enable accurate measurement of small and very small areas of a sample, while the XLAV plate is recommended for irregular and textured sample averaging.
Backward Compatibility
Backward Compatibility
Being compatible with the preceding Elrepho 3000 series, it achieves very close agreement among all instruments in your supply chain. Along with the instrument, the patented Datacolor SP 2000 spectrophotometer is included: a durable, pulsed xenon light source to approximate D65, an automated zoom lens, and adjustable, automated UV cut-off filters for three wavelengths to control the UV component from the light source.
Datacolor ELREPHO uses serial or USB connections to interface with the Datacolor TOOLS quality control software. It supports measurement procedures for the paper industry as defined by ISO, DIN, SCAN and TAPPI Standards.
What You get
- Six foot power cable
- Serial cable with connectors on either end
- USB cable
- Black trap
- White tile
- Green tile
Aperture Plates:
- Extra-Large Area View (XLAV)
- Small Area View (SAV)
- Ultra Small Area View (USAV)
Requirements
Power Requirements
85 to 264 VAC
47 to 63 Hz
80 VA peak
35 VA typical
Absolute Operating Range
5° to 40° C
5% to 85% non-condensing relative humidity
Technical Specifications
| Feature | Elrepho |
|---|---|
| Instrument Type | dual-beam spectrophotometer |
| Measurement Geometry | diffuse illumination and 0° viewing |
| Illumination Source | pulsed xenon filtered to approximate D65 |
| Sphere Diameter | 152 mm / 6.0 in |
| Spectral Analyzer | proprietary SP2000 analyzer with dual 256 diode array and high resolution holographic grating |
| Wavelength Range | 360 nm to 700 nm |
| Reporting Interval | 10 nm |
| Effective Bandwidth | 10 nm |
| Wavelength Resolution | 2 nm |
| Photometric Range: | 0 to 200% |
| Photometric Resolution | 0.003% |
| Black Trap | high performance |
| 20 Read Repeatability On The White Tile Using Dual Flash (CIELAB) |
0.02 (max) |
| Inter-instrument Agreement1 (CIELAB) |
0.4 (maximum), 0.2 (average) |
| Lens | 3 position auto zoom |
| XLAV Aperture plate | 34 mm illuminated and 30 mm measured |
| SAV Aperture plate | 9 mm illuminated and 5 mm measured |
| USAV Aperture plate | 6.5 mm illuminated and 2.5 mm measured |
| Automatic UV Control | automatic UV calibration for the measurement of fluorescent specimens with UV cutoff filters at 395 nm, 420 nm and 460 nm |
| Vertical Mount | includes peephole sample viewer and pedestal sample holder |
| Height | 640 mm / 25 3/16 in |
| Width | 312 mm / 12 5/16 in |
| Depth | 371 mm / 14 5/8 in |
| Weight | 19.05 kg / 42 lb |
| Power Requirements | 85 to 264 VAC, 47 to 63 Hz, 80 VA peak, 35 VA typical |
| Absolute Operating Range | 5° to 40° C, 5% to 85% non-condensing relative humidity |
| Interface | RS-232 9600/19200 baud |
